Tessent IJTAG
Siemens EDA’s automation of the IEEE 1687 standard Designing a modern product requires the integration of multiple IP blocks from both in-house and third party sources. The Tessent IJTAG software…
Tessent BoundaryScan
Comprehensive boundary scan and I/O test The Tessent BoundaryScan is a complete solution for automated generation and integration of on-chip test infrastructure, boundary scan, and test access port. Tessent BoundaryScan…
Tessent MemoryBIST
Embedded memory self-test, repair, and debug The Tessent MemoryBIST software and IP provides a complete solution for atspeed test, diagnosis, repair, debug, and characterization of embedded memories. The solution’s architecture…
Tessent TestKompress
Industry leading scan test tool The Tessent TestKompress industryleading automatic test pattern generation (ATPG) tool delivers the highest quality scan test with the lowest manufacturing test cost. TestKompress uses a…
Tessent FastScan
Industry leading ATPG solution Advanced design techniques used in today’s SoCs present significant challenges to achieving high-quality silicon test. Tessent FastScan is the gold standard in automatic test pattern generation…
Tessent ScanPro
Advanced DFT infrastructure Tessent ScanPro provides advanced scan DFT features that maximize the performance of scan-based test solutions such as those provided by the Tessent TestKompress, Tessent FastScan and Tessent…